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English Information

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Authors
# Name
1 Marleson Graf(marleson.graf@posgrad.ufsc.br)
2 Luiz Villar dos Santos(luiz.santos@ufsc.br)

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Reference
# Reference
1 Andrade, G. A. G., Graf, M., and dos Santos, L. C. V. (2020a). Chaining and Biasing: Test Generation Techniques for Shared-Memory Verification. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 39(3):728–741.
2 Andrade, G. A. G., Graf, M., Pfeifer, N., and dos Santos, L. C. V. (2018). Steep Coverage-ascent Directed Test Generation for Shared-memory Verification of Multicore Chips. In 2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).
3 Andrade, G. A. G., Graf, M., Pfeifer, N., and dos Santos, L. C. V. (2020b). A Directed Test Generator for Shared-Memory Verification of Multicore Chip Designs. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 39(12):5295–5303.
4 ARM (2018). ARM Architecture Reference Manual ARMv8, for ARMv8-A architecture profile.
5 Graf, M., Henschel, O. P., Alevato, R. P., and dos Santos, L. C. V. (2019). Spec&Check: An Approach to the Building of Shared-Memory Runtime Checkers for Multicore Chip Design Verification. In International Conference on Computer-Aided Design, pages 1–7.
6 Hennessy, J. L. and Patterson, D. A. (2017). Computer Architecture: A Quantitative Approach. Morgan Kaufmann Publishers Inc., San Francisco, CA, USA, 6th edition.
7 Martin, M. M., Hill, M. D., and Sorin, D. J. (2012). Why on-chip cache coherence is here to stay. Communications of the ACM, 55(7):78–89.
8 RISC-V (2019). The RISC-V Instruction Set Manual Volume I: Unprivileged ISA. Water-man, Andrew and Asanovi, Krste.